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The Best Solution To Verify Your NFC Applications

KEOLABS OFFERS OFF-THE-SHELF SOLUTIONS TO VERIFY CONFORMITY OF NFC ENABLED OBJECTS AND SYSTEMS TO RELEVANT STANDARDS INCLUDING NFC FORUM AND ISO/IEC 14443.

The testing environment meets strict conformance requirements to NFC Forum standards for verifying analog, digital and application implementations in passive devices (cards, tags, mobiles, etc) and active systems (readers, mobiles). 

 

The NFC Forum provides international test specifications for functional validation at the analog and protocol levels of phones, tags, devices and other systems implementing the NFC protocol in 13.56 Mhz contactless communications.

These specifications are the foundation for ensuring the reliability and interoperability of NFC systems and devices. The NFC Forum specifications and derived testing solutions allow conformance assessment of:

  • End-user contactless devices (smart cards (PICC), tags, keyfobs, NFC handsets)
  • Packaged devices (inlays, modules)
  • Embedded integrated circuits (hardware chips, secure elements)

KEOLABS provides complete testing solutions developed and qualified in accordance with NFC Forum requirements.

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Used by the best Mobile Makers

KEOLABS’ Analog, Digital and SNEP/LLCP test suites for NFC Forum testing allow validation of the analog, digital-level and SNEP/LLCP implementations of devices in polling or listening modes for use in NFC applications.

The testing solutions are complemented by a complete test bench that includes NFC testing accessories, which are developed in strict conformance their testing standards.

SCRIPTIS: an intuitive testing environement

SCRIPTIS™ software is a complete, open and simple testing environment. It runs on the user’s PC and allows easy control of a range of software/hardware solutions designed for testing conformance of smart cards, card readers, related components and systems in accordance with relevant industry standards.

KEOLABS’ test suites are used in SCRIPTIS™ testing environment which facilitates testing with automation features such as visual cues and aids for manual testing, or robot integration for fully automated testing. SCRIPTIS provides full visibility of test results including logs and traces of communications between the test bench and the tested device.

 

 

Technical Characteristics
License Options
Hardware Components

NFC FORUM ANALOG TEST SUITE (POLLER/LISTENER)

This NFC FORUM analog test suite is based on the standard:

NFC Forum Test Cases for Analog Version 2.0.11_2017-06-20 which is compliant with the NFC Certification Release 11 (CR11).

Test Cases for Tag Performance Version 1.0.00 2017-06-20 – CR11.

 

This solution is designed to test a device in all the NFC Forum operating volume in term of:

Listen Mode

  • Power Reception,
  • Loading Effect Measurement,
  • Carrier Frequency,
  • Modulation reception at limit conditions,
  • Load Modulation Amplitude,
  • Subcarrier Modulation

 

Poll Mode

  • Power Emission Measurement,
  • Carrier Frequency,
  • Reset Characteristics,
  • Modulation Measurement,
  • Load Modulation Amplitude Reception.

 

 

NFC FORUM DIGITAL TEST SUITE (POLLER/LISTENER)

This NFC FORUM Digital test suite is based on the standard:

NFC Forum Test Cases for Digital Protocol Version 2.0.00 2017-04-30 – CR11.

Also included the Test Cases for Type 2, 3, 4 and 5 Tag and Type 1, 2, 3 and 4 Tag Operation– CR11.

 

This solution is designed to test a device in term of:

Poll Mode

  • Group 1: Installation of NFC Forum Device with NFC-A, NFC-B, and NFC-F Technology
    • Group 1.1: Installation of NFC Forum Device with NFC-A, NFC-B, and NFC-F Technology
  • Group 2: NFC Forum Device in Poll Mode
    • Group 2.1: Installation of NFC Forum Device with NFC-A Technology
    • Group 2.2: Installation of NFC Forum Device with NFC-B Technology
    • Group 2.3: Installation of NFC Forum Device with NFC-F Technology
    • Group 2.4: Type 1 Tag (T1T) Platform
    • Group 2.5: Type 2 Tag (T2T) Platform
    • Group 2.6: Type 3 Tag (T3T) Platform
    • Group 2.7: Type 4A Tag (T4AT) Platform
    • Group 2.8: Type 4B Tag (T4BT) Platform
    • Group 2.9: Peer–to-Peer with NFC-A
    • Group 2.10: Peer–to-Peer with NFC-F
  • Tag Operation
    • Reading Tests
    • Writing Tests
    • Write on Read Only Tests

 

Listen Mode

  • Group 3: NFC Forum Device in Listen Mode
    • Group 3.1: Installation of NFC Forum Device with NFC-A Technology
    • Group 3.2: Installation of NFC Forum Device with NFC-B Technology
    • Group 3.3: Installation of NFC Forum Device with NFC-F Technology
    • Group 3.4: Type 3 Tag (T3T) Platform
    • Group 3.5: Type 4A Tag (T4AT) and Type 4B Tag (T4BT) Platform
    • Group 3.6: Type 5 Tag (T5T) Platform
    • Group 3.7: Peer–to-Peer with NFC-A
    • Group 3.8: Peer–to-Peer with NFC-F
  • Tag Application
    • Reading Tests
    • Writing Tests
    • Locking Tests
    • Read Only Tests

NFC FORUM LLCP/SNEP TEST SUITE (INITIATOR/TARGET)

This NFC FORUM LLCP/SNEP test suite is based on the standard:

NFC Forum Test Cases for LLCP Version 1.2.01 (December 2016)

NFC Forum Test Cases for SNEP Version 1.0.06 (December 2016)

 

This solution is designed to test a device in term of:

LLCP

  • Group 1: MAC Link Layer
    • Group 1.1: MAC Link Activation and Deactivation
    • Group 1.2: LLC Activation
    • Group 1.3: Normal Phase
    • Group 1.4: LLC Deactivation
    • Group 1.5: Symmetry Procedure
  • Group 2: Connectionless Transport Mode Tests
    • Group 2.1: Information Transfer
  • Group 3: Connection-Oriented Mode Tests
    • Group 3.1: Connection Establishment
    • Group 3.2: Information Transfer
    • Group 3.3: Receiver Busy Condition
    • Group 3.4: Connection Termination
    • Group 4: Aggregation Tests

 

SNEP

  • Client Tests
    • Basic Interconnection Tests
    • Put NDEF Message
    • Get NDEF Message
  • Server Tests
    • Basic Interconnection Tests
    • Accept NDEF Message
    • Return NDEF Message

 

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